Search results for "Atomic Force Microscopy"

Automated detection of protein unfolding events in atomic force microscopy force curves

2016

Atomic force microscopy is not only a high-resolution imaging device but also a mechanical machine, which can be used either to indent or stretch (soft) biomaterials. Due to the statistical nature of such materials (i.e., hydrogels or polymers) hundreds of force-distance curves are required to describe their mechanical properties. In this manuscript, we present an automated system for polymer unfolding detection based on continuous wavelet analysis. We have tested the automated program on elastin, which is an important protein that provides elasticity to tissues and organs. Our results show that elastin changes its mechanical behavior in the presence of electrolytes. In particular, we show …

Energy Barrier: Focus on the Essential: Extracting the Decisive Energy Barrier of a Complex Process (Adv. Mater. Interfaces 20/2019)

2019

Relating morphology to nanoscale mechanical properties: from crystalline to mesomorphic iPP

2005

Towards an atomistic understanding of solid friction by computer simulations

2002

Friction between two solid bodies in sliding motion takes place on a large spectrum of length and time scales: From the nanometer/second scale in an atomic force microscope up to the extremely macroscopic scales of tectonic motion. Despite our familiarity with friction, fundamental questions about its atomistic origins remain unanswered. Phenomenological laws that describe the friction in many systems were published more than 300 years ago by Amontons: The frictional force is proportional to the applied load and independent of the apparent area of contact. The atomistic origins of this simple law is still controversial. Many explanations, which seemed to be well-established until recently, …

Micro-Raman characterization of graphene grown on SiC(000-1)

2014

Graphene (Gr) was grown on the C face of 4H-SiC under optimized conditions (high annealing temperatures ranging from 1850 to 1950°C in Ar ambient at 900 mbar) in order to achieve few layers of Gr coverage. Several microscopy techniques, including optical microscopy (OM), ?Raman spectroscopy, atomic force microscopy (AFM) and atomic resolution scanning transmission electron microscopy (STEM) have been used to extensively characterize the lateral uniformity of the as-grown layers at different temperatures. ?Raman analysis provided information on the variation of the number of layers, of the stacking-type, doping and strain.

Effect of 15% carbamide peroxide bleaching gel on color stability of giomer and microfilled composite resin: an in vitro comparison

2011

Objectives: The effect of 15% carbamide peroxide bleaching gel on color stability and surface topography of a giomer and a microfilled composite resin was evaluated in the present in vitro study. Study design: Forty discs measuring 10 mm in diameter and 1 mm in thickness were prepared from a giomer and a microfilled composite resin. Each material yielded 20 discs with completely smooth surfaces. Then a spectrophotometer was used to measure L* (lightness), a* (redness, greenness) and b* (blueness, yellowness) color coordinates of all the discs. Subsequently, the specimens were subjected to 15% carbamide peroxide bleaching gel. After measuring the color coordinates once again, color changes (…

Sintering process of amorphous SiO2 nanoparticles investigated by AFM, IR and Raman techniques

2011

We report an experimental investigation on the effects of thermal treatments at different temperatures (room-1270 K) and for different duration (0-75 h) on amorphous silica nanoparticles (fumed silica) in powder tablet form. Three types of fumed silica are considered, comprising nearly spherical particles of 40 nm, 14 nm and 7 nm mean diameter. The experimental techniques used here are Raman and infrared absorption (IR) spectroscopy together with atomic force microscopy (AFM). Raman and IR spectra indicate that the structure of nanometer silica particles is significantly different with respect to that of a bulk silica glass. In particular, the main differences regard the positions of the IR…

Invasive Observation by Atomic Force Microscope of a Langmuir-Blodgett Monolayer of Gramicidin

2002

The properties of gramicidin, a linear antibiotic polypeptide of 15 amino acids, have been studied at the air-water interface. Analysis of the pressure-area isotherm is not able to conclude about the conformational behavior of gramicidin in the monolayer. Langmuir-Blodgett deposition of gramicidin layers onto a mica substrate has been developed for atomic force microscopy (AFM) observations. At high pressure of deposition, the gramicidin monolayer is composed of dimers perpendicular to the surface. The possibility of removing the half upper part of this dimer monolayer with the AFM tip is more in favor of a structure of single-stranded helical dimers.

Luminescent silicon nanocrystals produced by near-infrared nanosecond pulsed laser ablation in water

2014

Abstract We report the investigation of luminescent nanoparticles produced by ns pulsed Nd:YAG laser ablation of silicon in water. Combined characterization by AFM and IR techniques proves that these nanoparticles have a mean size of ∼3 nm and a core–shell structure consisting of a Si-nanocrystal surrounded by an oxide layer. Time resolved luminescence spectra evidence visible and UV emissions; a band around 1.9 eV originates from Si-nanocrystals, while two bands centered at 2.7 eV and 4.4 eV are associated with oxygen deficient centers in the SiO 2 shell.

Imaging of Located Buried Defects in Metal Samples by an Scanning Microwave Microscopy

2011

Abstract A non-destructive method is proposed to detect the located buried defects using scanning microwave microscopy. Based on the “skin effect”, our recent developments authorize 3D tomography with nanometric resolution. This technique associates the electromagnetic microwave measurement using a Vector Network Analyzer (VNA) with the nanometer-resolution positioning capabilities of an Atomic Force Microscope. At each used frequency, an incident electromagnetic wave is send to the sample and the reflected wave gives information on a specific depth layer in the material. With a large bandwidth of frequencies, a 3D tomography is allowed inside the material. With characteristic tools of nano…